1

Stuck fault test generation for dynamic CMOS

Asad A. Ismaeel
Journal:
Microelectronics Reliability
Year:
1994
Language:
english
File:
PDF, 573 KB
english, 1994
4

A stuck fault model for dynamic CMOS combinational circuits

Asad A. Ismaeel
Journal:
Microelectronics Reliability
Year:
1991
Language:
english
File:
PDF, 792 KB
english, 1991
6

Modeling for bridging faults in nMOS combinational circuits

Asad A. Ismaeel, Rakesh Bhatnagar, Mohammed Khan
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 775 KB
english, 1997
7

Modeling and testing for stuck faults in BiCMOS combinational circuits

Asad A. Ismaeel, Rakesh Bhatnagar
Journal:
Microelectronics Journal
Year:
1997
Language:
english
File:
PDF, 968 KB
english, 1997
9

Testing for stuck-at-faults in multiple output MOS combinational circuits

ISMAEEL, ASAD A.
Journal:
International Journal of Electronics
Year:
1989
Language:
english
File:
PDF, 135 KB
english, 1989
10

A transistor fault model for nMOS combinational circuits

Asad A. Ismaeel
Journal:
Microelectronics Journal
Year:
1991
Language:
english
File:
PDF, 539 KB
english, 1991
14

Testing for floating gate faults in CMOS combinational circuits

ISMAEEL, ASAD A.
Journal:
International Journal of Electronics
Year:
1991
Language:
english
File:
PDF, 307 KB
english, 1991
15

Algorithms for finding and updating minimum-depth spanning trees in parallel

Pranay Chaudhuri, Asad A. Ismaeel
Journal:
Information Sciences
Year:
1995
Language:
english
File:
PDF, 564 KB
english, 1995
16

Modelling and fault detection in microelectronic technologies

ISMAEEL, ASAD A., BHATNAGAR, RAKESH
Journal:
International Journal of Electronics
Year:
1995
Language:
english
File:
PDF, 393 KB
english, 1995